Kim Kook Jin, Yun Yong Ju, Ji Seungmuk, Lee Jong-Hyeon, Ha Dong Han
Division of Advanced Technology, Korea Research Institute of Standards and Science, Daejeon 305-600, Korea.
J Nanosci Nanotechnol. 2009 Aug;9(8):4786-91. doi: 10.1166/jnn.2009.1088.
We have produced Ni nanocrystals with face centered cubic structure by thermally annealing Ni films deposited on SiO2-covered Si(001) substrates in a flow of mixed hydrogen and argon gas. Ni films thicker than 5 nm self-assemble into highly (111)-oriented Ni nanocrystals on a flat and continuous SiO2 interlayer during the thermal annealing, while Ni films of 5 nm thickness aggregate to the irregularly shaped nanoparticles. The lateral width of the nanocrystals ranges from tens of nanometers to hundreds of nanometers, and the crystal height is under 100 nm. The nanocrystals have wide (111) top facets of hexagonal shape and narrow (100) sidewalls of truncated pyramidal shape, as a result of each crystal minimizing its total surface energy. Our results demonstrate that the formation of nanocrystals during thermal annealing is strongly affected by the morphology of the SiO2 interlayer, the Ni film thickness, the annealing temperature, and the partial pressure of hydrogen gas.
我们通过在氢气和氩气混合气流中对沉积在覆盖有SiO₂的Si(001)衬底上的镍膜进行热退火,制备出了具有面心立方结构的镍纳米晶体。在热退火过程中,厚度超过5 nm的镍膜在平坦且连续的SiO₂中间层上自组装成高度(111)取向的镍纳米晶体,而厚度为5 nm的镍膜则聚集成形状不规则的纳米颗粒。纳米晶体的横向宽度在几十纳米到几百纳米之间,晶体高度在100 nm以下。由于每个晶体都将其总表面能降至最低,纳米晶体具有宽的六边形(111)顶面和窄的截顶金字塔形(100)侧壁。我们的结果表明,热退火过程中纳米晶体的形成受到SiO₂中间层的形态、镍膜厚度、退火温度和氢气分压的强烈影响。