使用新型紧凑型超稳定二次谐波干涉仪对场反向配置等离子体进行电子密度测量。

Electron density measurements of a field-reversed configuration plasma using a novel compact ultrastable second-harmonic interferometer.

作者信息

Brandi F, Giammanco F, Harris W S, Roche T, Trask E, Wessel F J

机构信息

Department of Physics, University of Pisa, Largo B. Pontecorvo 3, 56127 Pisa, Italy.

出版信息

Rev Sci Instrum. 2009 Nov;80(11):113501. doi: 10.1063/1.3258199.

DOI:10.1063/1.3258199

PMID:19947725

Abstract

A compact high-sensitivity second-harmonic interferometer for line-integrated electron density measurements on a large plasma machine is presented. The device is based on a fiber coupled near-infrared continuous-wave Nd:YAG laser and is remotely controlled. The performances of the instrument are tested on the Irvine field-reversed configuration machine, and a sensitivity of few 10(14) cm(-2) in measuring line integrated electron density is demonstrated with a time resolution of a few microseconds. The interferometer is self calibrated, has an impressive stability, and it does not require any further alignment after proper installation. These features make this device a real turn-key system suitable for electron density measurement in large plasma machines.

摘要

介绍了一种用于大型等离子体装置上线积分电子密度测量的紧凑型高灵敏度二次谐波干涉仪。该装置基于光纤耦合近红外连续波Nd:YAG激光器，并且可以远程控制。该仪器的性能在欧文场反向配置装置上进行了测试，结果表明在测量线积分电子密度时灵敏度可达10的14次方厘米的负二次方数量级，时间分辨率为几微秒。该干涉仪可进行自校准，具有出色的稳定性，在正确安装后无需进一步对准。这些特性使该装置成为适用于大型等离子体装置中电子密度测量的真正交钥匙系统。