Badoual R, Giacomo P
Facult6 des Sciences de Caen, France.
Appl Opt. 1966 Jan 1;5(1):63-7. doi: 10.1364/AO.5.000063.
The preparation of dielectric multilayer coatings of nonequal thicknesses poses a problem of close control. The procedures of optical control of the coating itself (measurement of R or T extremes of R or T zeros of dR/dlambda, usually reserved for lambda/4 stacks) may also be used here; a preliminary study with the aid of an analog computer allows one to foresee progressively the different stages and to choose for each of the layers, the most precise method. The experimental results agree with the predicted.
制备不等厚度的介质多层涂层会带来精确控制的问题。涂层本身的光学控制程序（测量R或T的极值，或dR/dλ的R或T零点，通常用于λ/4堆叠）在此处也可使用；借助模拟计算机进行的初步研究使人们能够逐步预见不同阶段，并为每层选择最精确的方法。实验结果与预测相符。
