Lerman Gilad M, Levy Uriel
Department of Applied Physics, The Benin School of Engineering and Computer Science, The Center for Nanoscience and Nanotechnology, The Hebrew University of Jerusalem, Jerusalem, 91904, Israel.
Opt Express. 2009 Dec 7;17(25):23234-46. doi: 10.1364/OE.17.023234.
We propose and demonstrate a new interferometric approach in which a uniform phase difference between the arms of the interferometer manifests itself as spatially varying intensity distribution. The approach is based on interfering two orthogonal spatially varying vector fields, the radially and azimuthally polarized beams, and measuring the projection of the obtained field on an analyzer. This method provides additional spatial information that can be used to improve the smallest detectable phase change as compared with a conventional Michelson interferometer.
我们提出并演示了一种新的干涉测量方法，其中干涉仪两臂之间的均匀相位差表现为空间变化的强度分布。该方法基于干涉两个正交的空间变化矢量场，即径向偏振光束和方位角偏振光束，并测量所得场在分析仪上的投影。与传统的迈克尔逊干涉仪相比，该方法提供了额外的空间信息，可用于改善最小可检测相位变化。
