Boero G, Rusponi S, Kavich J, Rizzini A Lodi, Piamonteze C, Nolting F, Tieg C, Thiele J-U, Gambardella P
Ecole Polytechninque Federale de Lausanne, CH-1015 Lausanne, Switzerland.
Rev Sci Instrum. 2009 Dec;80(12):123902. doi: 10.1063/1.3267192.
We describe a setup for the x-ray detection of ferromagnetic resonance in the longitudinal geometry using element-specific transmission measurements. Thin magnetic film samples are placed in a static magnetic field collinear with the propagation direction of a polarized soft x-ray beam and driven to ferromagnetic resonance by a continuous wave microwave magnetic field perpendicular to it. The transmitted photon flux is measured both as a function of the x-ray photon energy and as a function of the applied static magnetic field. We report experiments performed on a 15 nm film of doped Permalloy (Ni(73)Fe(18)Gd(7)Co(2)) at the L(3)/L(2)-edges of Fe, Co, and Ni. The achieved ferromagnetic resonance sensitivity is about 0.1 monolayers/square root(Hz). The obtained results are interpreted in the framework of a conductivity tensor based formalism. The factors limiting the sensitivity as well as different approaches for the x-ray detection of ferromagnetic resonance are discussed.
我们描述了一种用于在纵向几何结构中通过元素特异性透射测量对铁磁共振进行X射线检测的装置。将薄磁性薄膜样品置于与偏振软X射线束传播方向共线的静磁场中，并通过垂直于该方向的连续波微波磁场驱动至铁磁共振状态。测量透射光子通量随X射线光子能量以及所施加静磁场的变化关系。我们报告了在掺杂坡莫合金（Ni(73)Fe(18)Gd(7)Co(2)）的15纳米薄膜上，在Fe、Co和Ni的L(3)/L(2)边缘处进行的实验。所实现的铁磁共振灵敏度约为0.1单层/√Hz。在基于电导率张量的形式体系框架内对所得结果进行了解释。讨论了限制灵敏度的因素以及用于铁磁共振X射线检测的不同方法。
