Schulz G, Schwider J
Institut für Optik und Spektroskopie,Deutsche Akademie der Wissenschaften zu Berlin, Berlin-Adlershof, Germany.
Appl Opt. 1967 Jun 1;6(6):1077-84. doi: 10.1364/AO.6.001077.
Interference methods are reviewed-particularly those developed at the German Academy of Sciences in Berlin-with which the deviations of an optically flat surface from the ideal plane can be measured with a high degree of exactness. One aid to achieve this is the relative methods which measure the differences in planeness between two surfaces. These are then used in the absolute methods which determine the absolute planeness of a surface. This absolute determination can be effected in connection with a liquid surface, or (as done by the authors) only by suitable evaluation of relative measurements between unknown plates in various positional combinations. Experimentally, one uses two- or multiple-beam interference fringes of equal thickness(1) or of equal inclination. The fringes are observed visually, scanned, or photographed, and in part several wavelengths or curves of equal density (Aquidensiten) are employed. The survey also brings the following new methods: a relative method, where, with the aid of fringes of superposition, the fringe separation is subdivided equidistantly thus achieving an increase of measuring precision, and an absolute method which determines the deviations of a surface from ideal planeness along arbitrary central sections, without a liquid surface, from four relative interference photographs.
本文综述了干涉测量方法,尤其是由柏林德国科学院开发的方法,利用这些方法可以高精度地测量光学平面与理想平面的偏差。实现这一目标的一种辅助方法是相对测量法,该方法测量两个表面之间的平面度差异。然后,这些方法被用于绝对测量法,以确定一个表面的绝对平面度。这种绝对测量可以与液体表面相关联来实现,或者(如作者所做的那样)仅通过对未知平板在各种位置组合下的相对测量进行适当评估来实现。在实验中,人们使用等厚(1)或等倾的双光束或多光束干涉条纹。通过目视观察、扫描或拍照来观察这些条纹,并且部分采用了几个波长或等密度曲线。本综述还介绍了以下新方法:一种相对测量法,借助叠加条纹将条纹间距等距细分,从而提高测量精度;以及一种绝对测量法,该方法无需液体表面,仅从四张相对干涉照片就能确定一个表面相对于理想平面度沿任意中心截面的偏差。