Hilton A R, Jones C E
Texas Instruments Inc., Dallas, Texas, USA.
Appl Opt. 1967 Sep 1;6(9):1513-7. doi: 10.1364/AO.6.001513.
An apparatus designed and built to measure the infrared refractive index of an optical material as a function of wavelength and temperature is described. The values obtained for the thermal change in refractive index of a Si-As-Te glass, a Ge-Sb-Sa glss, As(2)S(3) glass, and Kodak Irtran 4 are presented. Treatment of these data and literature values for other ir optical materials from a molar refraction standpoint, were used to establish an empirical relationship for predicting unknown DeltaN/DeltaT degrees C values of new optical materials. Measured values range from +300 x 10(-6)/ degrees C for covalent single crystal germanium to -235 x 10(-6)/ degrees C for ionic polycrystalline KRS-5.
描述了一种设计并制造的用于测量光学材料的红外折射率随波长和温度变化的仪器。给出了硅 - 砷 - 碲玻璃、锗 - 锑 - 硒玻璃、As₂S₃玻璃和柯达Irtran 4的折射率热变化值。从摩尔折射的角度对这些数据以及其他红外光学材料的文献值进行处理，以建立一种经验关系来预测新型光学材料未知的每摄氏度ΔN/ΔT值。测量值范围从共价单晶锗的 +300×10⁻⁶/℃到离子多晶KRS - 5的 -235×10⁻⁶/℃。
