Small R D, Sernas V A, Page R H
Appl Opt. 1972 Apr 1;11(4):858-62. doi: 10.1364/AO.11.000858.
A standard single pass schlieren system was converted into a single beam schlieren interferometer by replacing the knife edge with a polarizer-Wollaston prism-analyzer combination. The system is described and an analysis given that relates the fringe shifts on the interferogram to density changes in the test section. The proper location of the density difference is discussed.A complex gas dynamic flow field was investigated with this interferometer, and the results were shown to compare well with theoretical predictions.
通过用偏振器 - 沃拉斯顿棱镜 - 检偏器组合取代刀口,将标准的单通道纹影系统转换为单光束纹影干涉仪。描述了该系统,并进行了分析,将干涉图上的条纹移动与测试段中的密度变化联系起来。讨论了密度差的正确位置。用该干涉仪研究了一个复杂的气体动力学流场,结果表明与理论预测吻合良好。