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测量反射率和透射率的仪器校准。

Calibration of instruments measuring reflectance and transmittance.

作者信息

Bennett J M, Ashley E J

出版信息

Appl Opt. 1972 Aug 1;11(8):1749-55. doi: 10.1364/AO.11.001749.

Abstract

In calibrating instruments that measure reflectance and transmittance to a few tenths of a percent, it is desirable to have a sample that is smooth, uniform, nonabsorbing, and stable, so that the measured reflectance and transmittance will add to unity, and no light will be either absorbed or scattered outside the collecting optics. A properly prepared, thin, transparent, high index' film (such as CeO(2) or TiO(2)) on a fused quartz substrate is suitable for a calibration sample. Equations are given to calculate the reflectance and transmittance both at normal incidence and nonnormal incidence, as well as to correct for multiple reflections in the substrate and reflection from the back surface of the substrate. Factors such as aging and optical thickness nonuniformity, which can introduce systematic errors into the calibration, must be minimized by proper choice of materials and preparation techniques.

摘要

在校准测量反射率和透射率至百分之几的仪器时,需要有一个光滑、均匀、不吸收且稳定的样品,以便测得的反射率和透射率之和为1,并且没有光在收集光学器件之外被吸收或散射。在熔融石英基板上制备得当的薄透明高折射率薄膜(如CeO₂或TiO₂)适用于校准样品。文中给出了计算正入射和非正入射时反射率和透射率的方程,以及校正基板中的多次反射和基板背面反射的方程。老化和光学厚度不均匀性等可能在校准中引入系统误差的因素,必须通过适当选择材料和制备技术将其降至最低。

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