Center for Information Photonics and Communications, School of Information Science and Technology, Southwest Jiaotong University, Chengdu 610031, China.
Opt Lett. 2010 Feb 1;35(3):438-40. doi: 10.1364/OL.35.000438.
A photonic approach to the instantaneous measurement of multiple frequency components using a spectrally sliced incoherent source (SSIS) is proposed. In the proposed system, a broadband incoherent source is spectrally sliced using an etalon to generate an SSIS. Each channel of the SSIS is externally modulated by a microwave signal containing multiple frequency components. The modulated SSIS is then sent to a second etalon. Thanks to the difference between the free spectral ranges of the two etalons, multiple frequency components are simultaneously estimated from the power distribution at the output channels of the second etalon. Compared with the use of a laser source array, the use of an SSIS provides a simpler way to perform multiple-frequency-component measurement.
提出了一种使用光谱分切非相干光源（SSIS）实现多个频率分量的瞬时测量的光子学方法。在所提出的系统中，使用标准具对宽带非相干光源进行光谱分切以产生 SSIS。SSIS 的每个通道都由包含多个频率分量的微波信号进行外调制。然后将调制后的 SSIS 发送到第二个标准具。由于两个标准具的自由光谱范围之间的差异，从第二个标准具的输出通道的功率分布中可以同时估计多个频率分量。与使用激光源阵列相比，使用 SSIS 提供了一种更简单的方法来进行多频率分量测量。
