Ian Wark Research Institute, University of South Australia, Mawson Lakes, SA 5095, Australia.
Langmuir. 2010 Jun 1;26(11):8075-80. doi: 10.1021/la904482n.
The stability of water films has been investigated with a Mysels-Scheludko type film balance. Minor trace impurities in water do not affect the lifetime of water films under vapor saturation, but significantly influence the stability in free evaporation. Trace amounts of positively adsorbed contaminants induce Marangoni-driven flow that destabilizes films under evaporation conditions whereas negatively adsorbed electrolytes actually prolong stability by reversing interfacial tension gradients and driving a steady circulation within the film. At high thinning rates, pure-water films develop exotic-appearing flow patterns and break due to a strong coupling between hydrodynamic and interfacial tension-gradient adsorption stresses. The most dominant factor of transient film stabilization in dynamic conditions under evaporation is a surface tension gradient created in the film. We discuss surface tension gradients in transient films created by temperature differences, impurity concentration, and expansion of the films.
我们使用 Mysels-Scheludko 型薄膜天平研究了水膜的稳定性。水中痕量杂质在蒸汽饱和下不会影响水膜的寿命,但会显著影响自由蒸发下的稳定性。痕量的正吸附污染物会引发由 Marangoni 驱动的流动,从而在蒸发条件下使薄膜不稳定,而带负电荷的吸附电解质实际上通过反转界面张力梯度并在薄膜内驱动稳定的循环来延长稳定性。在高变薄率下,纯水膜会出现奇特的流动模式,并由于流体动力学和界面张力梯度吸附应力之间的强耦合而破裂。在蒸发下动态条件下瞬态薄膜稳定的最主要因素是在薄膜中产生的表面张力梯度。我们讨论了由温差、杂质浓度和薄膜膨胀引起的瞬态薄膜中的表面张力梯度。