Saloman E B
Appl Opt. 1975 Jun 1;14(6):1391-4. doi: 10.1364/AO.14.001391.
A technique is presented of using a single calibrated XUV detector for radiometric measurements of synchrotron radiation after the radiation passes through a monochromator that produces a mixture of first and second order diffracted radiation. Irradiance measurements are made with the synchrotron source operating at two different energies for the orbiting electrons. The known change in the spectral distribution produced by the electron energy change is used to calculate the flux in both first and second order. The dependence of the precision of these determinations on the two detected currents and on the detector calibration at both first and second order wavelengths is calculated. Experimental results using the National Bureau of Standards synchrotron (SURF-I) are presented, and anticipated results for the new NBS electron storage ring (SURF-II) are calculated.
本文介绍了一种技术，该技术使用单个校准的极紫外（XUV）探测器对同步辐射进行辐射测量，辐射穿过产生一阶和二阶衍射辐射混合的单色仪之后进行测量。在轨道电子处于两种不同能量下运行同步加速器源时进行辐照度测量。利用电子能量变化所产生的光谱分布的已知变化来计算一阶和二阶的通量。计算了这些测量精度对两个检测电流以及一阶和二阶波长处探测器校准的依赖性。给出了使用国家标准局同步加速器（SURF - I）的实验结果，并计算了新的国家标准局电子储存环（SURF - II）的预期结果。
