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通过在O(2)-N(2)混合气体中溅射钽制备可变折射率和双折射波导

Variable refractive index and birefringent waveguides by sputtering tantalum in O(2)-N(2) mixtures.

作者信息

Ingrey S J, Westwood W D, Cheng Y C, Wei J

出版信息

Appl Opt. 1975 Sep 1;14(9):2194-8. doi: 10.1364/AO.14.002194.

Abstract

Optical waveguides with losses <1 dB/cm at 632.8 nm have been prepared by sputtering tantalum in O(2)-N(2) mixtures. As the fraction of N(2) in the sputtering atmosphere increases, the refractive index of the guides exhibit a sharp maximum and then decreases to a much lower value, and the films become birefringent. Using an oxygen discharge, the indices at 632.8 nm for both TE and TM modes are 2.083 +/- 0.003, but the values are 1.850 and 1.877, respectively, for the highest fraction of nitrogen used. The indices have been measured at wavelengths down to 457.9 nm. For low fractions of N(2), the results are consistent with a decreasing film density and a constant molecular polarizability, but a number of effects, including the birefringence, are inconsistent with this picture. Waveguide structures, such as interconnects, branching waveguides, and layered directional couplers, have been demonstrated using films with different indices. The birefringence has also been verified by observation of interference between TE and TM modes simultaneously coupled into the guide.

摘要

通过在O(2)-N(2)混合气体中溅射钽,制备出了在632.8 nm波长处损耗<1 dB/cm的光波导。随着溅射气氛中N(2)含量的增加,光波导的折射率先急剧增大,然后降至低得多的值,并且薄膜变得具有双折射性。使用氧放电时,TE和TM模式在632.8 nm处的折射率均为2.083±0.003,但对于所使用的最高氮气含量,其值分别为1.850和1.877。已在低至457.9 nm的波长下测量了折射率。对于低含量的N(2),结果与薄膜密度降低和分子极化率恒定一致,但包括双折射在内的许多效应与该图像不一致。已经使用具有不同折射率的薄膜展示了诸如互连、分支光波导和分层定向耦合器等光波导结构。通过观察同时耦合到光波导中的TE和TM模式之间的干涉,也验证了双折射。

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