Peterson R C, Title A M
Appl Opt. 1975 Oct 1;14(10):2527-32. doi: 10.1364/AO.14.002527.
We describe a semiautomatic procedure for the reduction of high-dispersion echelle spectra recorded with an image tube. The spectra are traced with a computer-controlled microdensitometer that scans along the curved spectral orders. The curvature of each order is calculated approximately by a FORTRAN program from known grating and distortion parameters. A typical spectrum includes 25 orders (covering 1500 A) and is traced with a slit 0.012 A wide. To produce an atlas of intensity vs wavelength and to determine the equivalent widths of 300 lines currently require a day. We discuss the reduction procedures and time requirements in detail.
我们描述了一种用于处理用像管记录的高色散阶梯光栅光谱的半自动方法。光谱由计算机控制的微密度计进行跟踪，该微密度计沿着弯曲的光谱级进行扫描。每个光谱级的曲率由一个FORTRAN程序根据已知的光栅和畸变参数近似计算得出。一个典型的光谱包含25个光谱级（覆盖1500埃），用宽度为0.012埃的狭缝进行跟踪。要生成强度与波长的图谱并确定300条谱线的等效宽度目前需要一天的时间。我们详细讨论了处理步骤和时间要求。
