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单电子盒中的过剩耗散:西西弗斯电阻。

Excess dissipation in a single-electron box: the Sisyphus resistance.

机构信息

Department of Microtechnology and Nanoscience (MC2), Chalmers University of Technology, SE-412 96 Goteborg, Sweden.

出版信息

Nano Lett. 2010 Mar 10;10(3):953-7. doi: 10.1021/nl903887x.

Abstract

We present measurements of the ac response of a single-electron box (SEB). We apply a radio frequency signal with a frequency larger than the tunneling rate and drive the system out of equilibrium. We observe much more dissipation in the SEB then one would expect from a simple circuit model. We can explain this in terms of a mechanism that we call the Sisyphus resistance. The Sisyphus resistance has a strong gate dependence which can be used for electrometery applications.

摘要

我们展示了对单个电子盒(SEB)的交流响应的测量结果。我们施加一个频率大于隧穿率的射频信号,使系统处于非平衡状态。我们观察到 SEB 中的耗散比简单的电路模型所预期的要多得多。我们可以用一种称为西西弗斯电阻的机制来解释这一点。西西弗斯电阻具有很强的栅极依赖性,可用于电测量应用。

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