Confer D L, Azzam R M, Bashara N M
Appl Opt. 1976 Oct 1;15(10):2568-75. doi: 10.1364/AO.15.002568.
The process of nulling in ellipsometry is studied by a graphical presentation using the trajectories of two significant polarization states in the complex plane, (XPC) and (XSA). These states are determined by (1) the polarizer and compensator ((XPC)) and (2) the specimen and the analyzer ((XSA)) in the polarizer-compensator-specimen-analyzer ellipsometer arrangement. As the azimuth angles of the ellipsometer elements are varied, (XPC) and (XSA) move closer to one another in a stepwise fashion until they coincide when a null is reached. Thus, at null, the polarization states are matched, and (XPC) = (XSA). For an isotropic reflector, the trajectory of (XSA) is a straight line, which simplifies the development of a criterion for achieving the most rapid nulling for two nulling procedures.
通过使用复平面中两个重要偏振态（XPC）和（XSA）的轨迹的图形表示法来研究椭偏测量中的消光过程。这些状态由（1）偏振器和补偿器（（XPC））以及（2）偏振器 - 补偿器 - 样品 - 分析器椭偏仪配置中的样品和分析器（（XSA））确定。随着椭偏仪元件的方位角变化，（XPC）和（XSA）以逐步方式彼此靠近，直到达到消光时它们重合。因此，在消光时，偏振态匹配，且（XPC）=（XSA）。对于各向同性反射器，（XSA）的轨迹是一条直线，这简化了为两种消光程序实现最快消光的判据的推导。
