Shealy D L
Appl Opt. 1976 Oct 1;15(10):2588-96. doi: 10.1364/AO.15.002588.
The analytical illuminance monitoring technique provides an exact expression within the geometrical optics limit for the illuminance over an image surface for light that has passed through a multiinterface optical system. The light source may be collimated rays, a point source, or an extended source. The geometrical energy distributions can be graphically displayed as a line or point spread function over selected image planes. The analytical illuminance technique gives a more accurate and efficient computer technique for evaluating the energy distribution over an image surface than the traditional scanning of the spot diagram mathematically with a narrow slit. The analytical illuminance monitoring technique also provides a closed form expression for the caustic surface of the optical system. It is shown by examining the caustic surface for anumber of lens systems from the literature that the caustic is a valuable merit function for evaluating the aberrations and the size of the focal region.
解析照度监测技术在几何光学极限范围内，为穿过多界面光学系统的光在图像表面的照度提供了精确表达式。光源可以是准直光线、点光源或扩展光源。几何能量分布可以以线或点扩散函数的形式在选定的图像平面上图形化显示。与传统的用窄缝对散斑图进行数学扫描相比，解析照度技术为评估图像表面的能量分布提供了一种更准确、高效的计算机技术。解析照度监测技术还为光学系统的焦散面提供了一个封闭形式的表达式。通过研究文献中多个透镜系统的焦散面表明，焦散是评估像差和焦区大小的一个有价值的品质因数。
