Malacara D, Mallick S
Appl Opt. 1976 Nov 1;15(11):2695-7. doi: 10.1364/AO.15.002695.
A new type of lateral shear holographic interferometer is described. It can be used to test lenses as well as spherical and aspherical surfaces. A null pattern with straight fringes can be obtained for an aspherical surface, provided one has a prototype that can be used for making the hologram.
本文介绍了一种新型的横向剪切全息干涉仪。它可用于测试透镜以及球面和非球面。对于非球面,只要有一个可用于制作全息图的原型,就可以获得带有直线条纹的零级条纹图样。