Lindsay S M, Burgess S, Shepherd I W
Appl Opt. 1977 May 1;16(5):1404-7. doi: 10.1364/AO.16.001404.
The sharper instrumental profile of the multipassed Fabry-Perot etalon introduces distortions to Brillouin spectra which may differ considerably from those introduced by the single-pass etalon. The half-width at half-height of the observed profile is calculated for five-pass and three-pass spectrometers. Phonon spectral widths may be extracted from the graphs and appropriate relationships are presented. These calculations are valid for well aligned etalons when the phonon lineshape is Lorentzian and cover a wide range of instrumental and phonon spectral widths.
多程法布里-珀罗标准具更尖锐的仪器轮廓会给布里渊光谱引入畸变,这种畸变可能与单程标准具引入的畸变有很大差异。针对五程和三程光谱仪计算了观测轮廓的半高宽。声子光谱宽度可从图表中提取,并给出了适当的关系。当声子线形为洛伦兹分布时,这些计算对于校准良好的标准具是有效的,并且涵盖了广泛的仪器和声子光谱宽度范围。