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基于势垒降低效应的 ZnO 纳米线埋入肖特基二极管的有效紫外探测

ZnO nanowire-embedded Schottky diode for effective UV detection by the barrier reduction effect.

机构信息

Nano-Mechanical Systems Research Division, Korea Institute of Machinery and Materials (KIMM), Daejeon, Korea.

出版信息

Nanotechnology. 2010 Mar 19;21(11):115205. doi: 10.1088/0957-4484/21/11/115205. Epub 2010 Feb 22.

Abstract

A zinc oxide nanowire (ZnO NW)-embedded Schottky diode was fabricated for UV detection. Two types of devices were prepared. The ZnO NW was positioned onto asymmetric metal electrodes (Al and Pt) for a Schottky device or symmetric metal electrodes (Al and Al) for an ohmic device, respectively. The Schottky device provided a rectifying current flow and was more sensitive to UV illumination than the ohmic device. The Schottky barrier plays an important role for UV detection by a UV-induced barrier reduction effect. The fabrication of the ZnO NW-embedded Schottky diode and the UV reaction mechanism are discussed in light of the UV light-induced Schottky barrier reduction effect.

摘要

一种氧化锌纳米线(ZnO NW)嵌入肖特基二极管被制造用于紫外光探测。两种器件被制备。氧化锌纳米线分别被置于不对称金属电极(Al 和 Pt)用于肖特基器件,或者置于对称金属电极(Al 和 Al)用于欧姆器件。肖特基器件提供整流电流,并且比欧姆器件对紫外光照射更敏感。肖特基势垒通过紫外诱导势垒降低效应对于紫外光探测起重要作用。基于紫外光诱导肖特基势垒降低效应,讨论了 ZnO NW 嵌入肖特基二极管的制备和紫外光反应机制。

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