Chang Yin-Jung, Gaylord Thomas K
Department of Optics and Photonics, National Central University, Taiwan, R.O.C.
Opt Express. 2010 Jan 18;18(2):809-21. doi: 10.1364/OE.18.000809.
The birefringence in nanometer-scale dielectrics with the largest dimensions ranging from about 3 nm to 20 nm has been quantified by evaluating directly the summation of induced-dipole-electric-field contributions from all individual atoms within the entire dielectric volume. Various configurations in representative cubic and tetragonal systems are investigated by varying the ratio of lattice constants and the number of atoms in various directions to illustrate the chain-like and plane-like behavior regimes. The dielectric properties of the finite cubic crystal lattices change from isotropic to birefringent (uniaxial or biaxial) when the entire dielectric volume is changed from a cube to a rectangular parallelepiped in shape. In finite tetragonal crystals the birefringence increases with the increasing lattice constant ratios. The largest uniaxial birefringence occurs for non-cube dielectric volume with tetragonal lattices.
通过直接评估整个电介质体积内所有单个原子的感应偶极子电场贡献的总和,对最大尺寸范围约为3纳米至20纳米的纳米级电介质中的双折射进行了量化。通过改变晶格常数的比率和不同方向上的原子数量,研究了代表性立方和四方系统中的各种构型,以说明链状和平面状行为模式。当整个电介质体积从立方体形状变为长方体形状时,有限立方晶格的介电特性从各向同性变为双折射(单轴或双轴)。在有限四方晶体中,双折射随着晶格常数比率的增加而增加。对于具有四方晶格的非立方电介质体积,会出现最大的单轴双折射。