Baida F I, Van Labeke D, Vigoureux J M
Appl Opt. 1978 Mar 1;17(5):858-66.
Longitudinal and transverse shifts of a light beam at total internal reflection was experimentally studied by far-field measurements on the reflected field. We propose to use a scanning tunneling optical microscope (STOM) to study these shifts in transmission, and we present a theoretical model of this proposed experiment to obtain a numerical estimation of these shifts. We study the reflection and the transmission of a three-dimensional polarized incident beam. We verify the validity of our formalism by studying the Goos-Hanchen shift in reflection and by comparing our results with published ones. Then we calculate STOM images of the transmitted field distribution. On the images the well-known Goos-Hanchen shift is easily observed. But we also encounter a smaller shift, perpendicular to the plane of incidence. This transverse shift was also observed in reflection by Imbert and Levy [Nouv. Rev. Opt. 6, 285 (1975)]. We study the variations of the two shifts versus various parameters such as the angle of incidence, the optical index, and the incident polarization. Then we discuss the feasibility of the near-field observation of these shifts.
通过对反射场进行远场测量，对全内反射时光束的纵向和横向位移进行了实验研究。我们建议使用扫描隧道光学显微镜（STOM）来研究透射中的这些位移，并给出了该实验的理论模型以获得这些位移的数值估计。我们研究了三维偏振入射光束的反射和透射。通过研究反射中的古斯 - 汉欣位移并将我们的结果与已发表的结果进行比较，验证了我们形式主义的有效性。然后我们计算了透射场分布的STOM图像。在图像上很容易观察到著名的古斯 - 汉欣位移。但我们也遇到了一个垂直于入射平面的较小位移。这种横向位移也曾被安贝尔特和利维在反射中观察到[《新光学评论》6, 285 (1975)]。我们研究了这两种位移随各种参数（如入射角、光学折射率和入射偏振）的变化。然后我们讨论了这些位移近场观测的可行性。
