Mouchart J
Appl Opt. 1978 May 1;17(9):1458-65. doi: 10.1364/AO.17.001458.
This paper considers the relations between thin film indices for making an antireflection coating when all optical thicknesses are equal. In this way, it is possible to determine antireflection coatings for two given wavelengths. Various cases are studied according to the two wavelengths and the index of the substrate.
本文考虑了在所有光学厚度相等时,用于制造减反射涂层的薄膜折射率之间的关系。通过这种方式,可以确定针对两个给定波长的减反射涂层。根据这两个波长和基底的折射率,研究了各种情况。