Debell A G, Dereniak E L, Harvey J, Nissley J, Palmer J, Selvarajan A, Wolfe W L
Appl Opt. 1979 Sep 15;18(18):3114-5. doi: 10.1364/AO.18.003114.
The index of refraction and its variation with wavelength and temperature were measured for cadmium telluride made by chemical vapor deposition (CVD). The measurement at 20 K using liquid helium as coolant is reported for the first time. The refractive index at 10 microm and 20 K is 2.6466, and the average temperature coefficient at 10 microm and in the range 20-80 K is 4.9 x 10(-5)/K.