碲化镉在6微米至22微米范围内的低温折射率和温度系数
Cryogenic refractive indices and temperature coefficients of cadmium telluride from 6 microm to 22 microm.
作者信息
Debell A G, Dereniak E L, Harvey J, Nissley J, Palmer J, Selvarajan A, Wolfe W L
出版信息
Appl Opt. 1979 Sep 15;18(18):3114-5. doi: 10.1364/AO.18.003114.
PMID:20212812
Abstract
The index of refraction and its variation with wavelength and temperature were measured for cadmium telluride made by chemical vapor deposition (CVD). The measurement at 20 K using liquid helium as coolant is reported for the first time. The refractive index at 10 microm and 20 K is 2.6466, and the average temperature coefficient at 10 microm and in the range 20-80 K is 4.9 x 10(-5)/K.
摘要
测量了通过化学气相沉积（CVD）制备的碲化镉的折射率及其随波长和温度的变化。首次报道了使用液氦作为冷却剂在20K下的测量结果。10微米波长和20K时的折射率为2.6466，10微米波长以及20 - 80K范围内的平均温度系数为4.9×10⁻⁵/K。
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