Research Center of Nanoscience and Nanotechnology, Shanghai University, 99 Shangda Road, Shanghai 200444, PR China.
J Colloid Interface Sci. 2010 Jun 1;346(1):12-6. doi: 10.1016/j.jcis.2010.02.031. Epub 2010 Feb 19.
Fluorine-doped tin dioxide (FTO) nanocrystals were prepared with a sol-gel process followed by a hydrothermal treatment using SnCl(4) and NH(4)F as SnO(2) and fluorine dopant, respectively. The nanostructure and composition were characterized by X-ray diffraction (XRD), transmission electron microscopy (TEM), high-resolution transmission electron microscopy (HRTEM), zeta potential analysis, electrochemical measurement technology and X-ray photoelectron spectroscopy (XPS) respectively. The diameter of the fluorine doped SnO(2) nanocrystal in rutile-type structure is about 10nm. Compared to the pure SnO(2) nanocrystals, the fluorine doped SnO(2) nanocrystals can be dispersed homogeneously in H(2)O, forming transparent sol with high stability. The powder of fluorine doped SnO(2) nanocrystals could be obtained by removing the solvent, and the electrical resistivity properties were measured by a four-point probe measurement. The results show that sheet resistances (Rs) of fluorine doped SnO(2) decrease with the increasing NH(4)F/Sn molar ratio in the range from 0 to 2. However, further increase of NH(4)F/Sn molar ratio from 2 to 5 leads to higher sheet resistance. The F/Sn molar ratio of fluorine doped SnO(2) measured by XPS is about 0.18 when NH(4)F/Sn molar ratio is equal to 2, and the sheet resistance of fluorine doped SnO(2) powder is 110Ω/□.
掺氟二氧化锡(FTO)纳米晶采用溶胶-凝胶法制备,然后通过水热法处理,分别以 SnCl4 和 NH4F 作为 SnO2 和氟掺杂剂。通过 X 射线衍射(XRD)、透射电子显微镜(TEM)、高分辨率透射电子显微镜(HRTEM)、Zeta 电位分析、电化学测量技术和 X 射线光电子能谱(XPS)分别对纳米结构和组成进行了表征。金红石型结构中掺氟 SnO2 纳米晶的直径约为 10nm。与纯 SnO2 纳米晶相比,掺氟 SnO2 纳米晶可均匀分散在 H2O 中,形成高稳定性的透明溶胶。通过去除溶剂可获得掺氟 SnO2 纳米晶的粉末,并通过四点探针测量测量其电阻率特性。结果表明,在 0 至 2 的范围内,掺氟 SnO2 的方块电阻(Rs)随 NH4F/Sn 摩尔比的增加而降低。然而,当 NH4F/Sn 摩尔比从 2 增加到 5 时,Rs 会进一步增加。当 NH4F/Sn 摩尔比等于 2 时,XPS 测量的掺氟 SnO2 中的 F/Sn 摩尔比约为 0.18,掺氟 SnO2 粉末的方块电阻为 110Ω/□。