Kim Jin-Gyu, Song Kyung, Kwon Kihyun, Hong Kimin, Kim Youn-Joong
Division of Electron Microscopic Research, Korea Basic Science Institute, 113 Gwahangno, Yuseong-gu, Daejeon, Korea.
J Electron Microsc (Tokyo). 2010;59(4):273-83. doi: 10.1093/jmicro/dfq006. Epub 2010 Mar 25.
We performed structure analysis of Si single crystal and CaMoO(4) inorganic crystal by energy-filtered precession electron diffraction (PED). Structure analysis was performed using conventional selected area electron diffraction, PED and energy-filtered PED (EF-PED). The EF-PED method proved to be advantageous in determining the crystal structures and accurate cell parameters of inorganic crystals due to resolution enhancement by sharpening the peak shapes and reducing inelastic scattering. Among the EF-PED methods, zero-loss PED was most useful for structure analysis by minimizing inelastic scattering intensities, while plasmon-loss PED could be used effectively to determine crystal symmetry by closely observing the conditions of forbidden reflections.
我们通过能量过滤进动电子衍射（PED）对硅单晶和钼酸钙（CaMoO₄）无机晶体进行了结构分析。使用传统选区电子衍射、PED和能量过滤PED（EF-PED）进行结构分析。EF-PED方法在确定无机晶体的晶体结构和精确晶胞参数方面被证明具有优势，因为它通过锐化峰形和减少非弹性散射来提高分辨率。在EF-PED方法中，零损失PED通过最小化非弹性散射强度对结构分析最为有用，而等离子体损失PED可以通过密切观察禁戒反射条件有效地用于确定晶体对称性。
