Department of Electrical and Computer Engineering, University of Delaware, Newark, Delaware 19716, USA.
Opt Lett. 2010 Apr 1;35(7):998-1000. doi: 10.1364/OL.35.000998.
We compare the two prevailing raised-microdisk whispering-gallery-mode (WGM) characterization techniques, one based on coupling emission to a tapered fiber and the other based on collecting emission in the far field. We applied both techniques to study WGMs in Si nanocrystal raised microdisks and observed dramatically different behavior. We explain this difference in terms of the radiative bending loss on which the far-field collection technique relies and discuss the regimes of operation in which each technique is appropriate.
我们比较了两种流行的微盘 whispering-gallery-mode（WGM）特性化技术，一种基于耦合发射到锥形光纤，另一种基于在远场收集发射。我们应用这两种技术研究了 Si 纳米晶体微盘的 WGM，并观察到了截然不同的行为。我们根据远场收集技术所依赖的辐射弯曲损耗来解释这种差异，并讨论了每种技术适用的工作范围。
