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使用高分辨率 X 射线相衬显微断层摄影术对木材和植物微观结构进行微米级 3D 成像。

Micron-scale 3D imaging of wood and plant microstructure using high-resolution X-ray phase-contrast microtomography.

机构信息

CSIRO Materials Science and Engineering, Private Bag 33, Clayton, Victoria 3169, Australia.

出版信息

J Struct Biol. 2010 Aug;171(2):182-8. doi: 10.1016/j.jsb.2010.04.001. Epub 2010 Apr 9.

Abstract

The structure of wood on a range of length-scales is critical to the performance and properties of this industrially important natural material. Much analysis of wood on the micron-scale upwards is carried out in two dimensions using optical microscopy. In recent years, however, three-dimensional (3D) analysis using X-ray microtomography has proved to be of increasing interest, providing volumetric data without the risk of damage from physical sectioning. In the present work we explore the potential of laboratory-based phase-contrast X-ray microtomography for analysis of wood microstructure on the micron scale. 3D datasets with quality enhanced by the use of phase-contrast, have been obtained for a number of different wood specimens. Segmentation of the datasets followed by different types of quantitative analysis is also successfully demonstrated, confirming the value of this technique for high-resolution analysis of 3D wood microstructure.

摘要

木材的结构在各种长度尺度上对这种工业重要的天然材料的性能和特性都至关重要。在微米尺度及以上,使用光学显微镜在二维上对木材进行了大量分析。然而,近年来,使用 X 射线微断层扫描的三维(3D)分析越来越受到关注,它提供了体积数据,而不会有物理剖切造成损坏的风险。在本工作中,我们探索了基于实验室的相衬 X 射线微断层扫描在微米尺度上分析木材微观结构的潜力。通过使用相衬增强质量,已经获得了一些不同木材样本的 3D 数据集。通过对数据集进行分割,然后进行不同类型的定量分析,也成功地证明了该技术在 3D 木材微观结构的高分辨率分析中的价值。

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