Solar Cell Group, Centre for Materials Science and Engineering, Cranfield University, Shrivenham, Swindon, SN6 8LA, UK.
Anal Chem. 2010 Jun 1;82(11):4564-9. doi: 10.1021/ac100572h.
With the increasing demand for new materials, analytical techniques which are able to rapidly characterize a large number of samples are becoming indispensable. Thin film technology has the potential to improve the amount of information contained on as-deposited samples by creating compositionally graded libraries. Conventionally, raster scan methods are used to interrogate such libraries but, in this paper, a different approach is presented to provide a method of high-throughput data collection and analysis using an X-ray diffraction (XRD) probe. An extended X-ray beam was used to illuminate the libraries, and a large area detector was used to collect the data. A new algorithm "Bandit" has been employed to analyze the collected data and extract the crystallographic information. The results of the technique have been compared with the raster scans showing that the algorithm provides reliable data at a significantly increased data acquisition speed.
随着对新材料需求的不断增加，能够快速分析大量样品的分析技术变得不可或缺。薄膜技术通过创建成分渐变库，有可能提高沉积样品中包含的信息量。传统上，使用光栅扫描方法来检测这些库，但在本文中，提出了一种不同的方法，使用 X 射线衍射 (XRD) 探头提供高通量数据采集和分析的方法。扩展的 X 射线束用于照射库，使用大面积探测器收集数据。已经使用新的算法“Bandit”来分析收集的数据并提取晶体学信息。该技术的结果与光栅扫描进行了比较，结果表明该算法以显著提高的数据采集速度提供了可靠的数据。
