Lindberg J D
Appl Opt. 1987 Jul 15;26(14):2900-5. doi: 10.1364/AO.26.002900.
A method is presented whereby any photometer than can measure relative diffuse reflectance of materials in the laboratory can be used to measure absolute diffuse reflectance of such samples without any modification to the apparatus. No additional integrating spheres or special optical geometries are required. All that is needed are two powdered materials, one a very strong absorber and one a very weak absorber at the wavelength of interest, a requirement that is not difficult to meet. A theoretical development based on the Kubelka-Munk theory, the results of experimental testing, and an error analysis are presented.
本文提出了一种方法,通过该方法,任何能够在实验室中测量材料相对漫反射率的光度计都可用于测量此类样品的绝对漫反射率,而无需对仪器进行任何修改。不需要额外的积分球或特殊的光学几何结构。所需的只是两种粉末材料,一种是在所关注波长下的强吸收剂,另一种是弱吸收剂,这一要求不难满足。文中给出了基于库贝尔卡-蒙克理论的理论推导、实验测试结果以及误差分析。