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横跨 TiN 电极间隙的水平悬挂 CNTs 的生长和特性研究。

Growth and characterization of horizontally suspended CNTs across TiN electrode gaps.

机构信息

IMEC, Kapeldreef 75, B-3001 Leuven, Belgium.

出版信息

Nanotechnology. 2010 Jun 18;21(24):245604. doi: 10.1088/0957-4484/21/24/245604. Epub 2010 May 25.

Abstract

A technique is proposed to grow horizontal carbon nanotubes (CNTs) bridging metal electrodes and to assess their electrical properties. A test structure was utilized that allows for selective electrochemical sidewall catalyst placement. The selectivity of the technique is based on the connection of the desired metal electrodes to the silicon substrate where the potential for electrochemical deposition was applied. Control over the Ni catalyst size (15-30 nm) and density (up to 3 x 10(11) particles cm(-2)) is demonstrated. Horizontal CNTs with controlled diameter and density were obtained by CVD growth perpendicular to the sidewalls of patterned TiN electrode structures. Electrode gaps with spacings from 200 nm up to 5 microm could be bridged by both direct CNT-electrode contact and CNT-CNT entanglement. The TiN-CNT-TiN and TiN-CNT-CNT-TiN bridges were electrically characterized without any further post-growth contacting. Resistance values as low as 40 Omega were measured for the smallest gap spacing and depended mainly on the number and configuration of the CNT bridges. The proposed method could be implemented for CNT-based horizontal interconnections and be a route to make different nanoelectronic devices such as chemical and electromechanical sensors.

摘要

提出了一种生长横跨金属电极的水平碳纳米管(CNT)并评估其电学性能的技术。利用了一种允许选择性电化学侧壁催化剂放置的测试结构。该技术的选择性基于将所需的金属电极连接到硅衬底上,在硅衬底上施加了电化学沉积的电势。证明了对 Ni 催化剂尺寸(15-30nm)和密度(高达 3 x 10(11)个颗粒/cm(-2))的控制。通过垂直于图案化 TiN 电极结构的侧壁进行 CVD 生长,获得了具有受控直径和密度的水平 CNT。通过直接 CNT-电极接触和 CNT-CNT 缠结,可以桥接间距从 200nm 到 5μm 的电极间隙。无需进一步的后生长接触,就对 TiN-CNT-TiN 和 TiN-CNT-CNT-TiN 桥进行了电特性表征。对于最小的间隙间距,测量到的电阻值低至 40Ω,这主要取决于 CNT 桥的数量和配置。所提出的方法可用于基于 CNT 的水平互连,并可作为制造不同的纳米电子器件(如化学和机电传感器)的途径。

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