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光激发移动载流子对BSO中占据的深陷阱中心的电荷屏蔽效应。

Charge shielding effects of photoexcited mobile carriers on occupied deep trapping centers in BSO.

作者信息

Attard A E

出版信息

Appl Opt. 1988 Jan 15;27(2):232-8. doi: 10.1364/AO.27.000232.

DOI:10.1364/AO.27.000232
PMID:20523585
Abstract

Evidence is presented to support the theory that photoexcited charge carriers screen the field due to the trapped charges that form the phase grating in photorefractive materials. The diffraction intensity due to the grating and the decay time constants of the trapped charges are influenced by this screening. Electricfield modulation of these effects is also present. The effects have been measured and compared to the expected generation rates of free and trapped charges.

摘要

有证据支持这样一种理论

光激发的电荷载流子会屏蔽因光折变材料中形成相位光栅的俘获电荷所产生的电场。由光栅引起的衍射强度以及俘获电荷的衰减时间常数会受到这种屏蔽的影响。这些效应还存在电场调制。已对这些效应进行了测量,并与自由电荷和俘获电荷的预期产生率进行了比较。

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