渐变折射率玻璃制造过程中的实时折射率分布测量。
Real-time index profile measurement during GRIN glass fabrication.
作者信息
Houde-Walter S, Moore D T
出版信息
Appl Opt. 1988 Feb 1;27(3):508-15. doi: 10.1364/AO.27.000508.
PMID:20523632
Abstract
A new instrument for measuring the evolution of index profiles during diffusion in hot (500 degrees C) glass is presented. This instrument, called the oven interferometer, has a spatial resolution of 10 microm at 0.6471 microm and a phase resolution of lambda/50. The development of index profiles with both time-dependent and constant boundary conditions is shown.
摘要
介绍了一种用于测量热（500摄氏度）玻璃中扩散过程中折射率分布演变的新仪器。这种仪器称为炉式干涉仪，在波长0.6471微米时空间分辨率为10微米，相位分辨率为λ/50。展示了在随时间变化和恒定边界条件下折射率分布的发展情况。
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