Laboratoire de Chimie Physique, CNRS, UMR 7614, Matière et Rayonnement, 11 rue Pierre et Marie Curie, 75231 Paris Cedex 05, France.
J Chem Phys. 2009 Oct 21;131(15):154308. doi: 10.1063/1.3243849.
A vapor-deposited NH(3) ice film irradiated at 20 K with 150 eV photons has been studied with near-edge x-ray absorption fine structure (NEXAFS) spectroscopy at the nitrogen K-edge. Irradiation leads to the formation of high amounts (12%) of molecular nitrogen N(2), whose concentration as a function of the absorbed energy has been quantified to 0.13 molecule/eV. The stability of N(2) in solid NH(3) has been also studied, showing that N(2) continuously desorbs between 20 and 95 K from the irradiated ammonia ice film. Weak concentrations (<1%) of other photoproducts are also detected. Our NEXAFS simulations show that these features own to NH(2), N(2)H(2), and N(3)(-).
用近边 X 射线吸收精细结构（NEXAFS）光谱法在氮 K 边研究了在 20 K 用 150 eV 光子辐照的气相沉积 NH（3）冰膜。辐照导致形成大量（12%）的分子氮 N（2），其浓度作为吸收能量的函数已被量化到 0.13 个分子/电子伏特。还研究了 N（2）在固态 NH（3）中的稳定性，表明 N（2）在 20 和 95 K 之间连续从辐照的氨冰膜中解吸。还检测到其他光产物的弱浓度（<1%）。我们的 NEXAFS 模拟表明，这些特征属于 NH（2）、N（2）H（2）和 N（3）（-）。
