Stagg B J, Charalampopoulos T T
Appl Opt. 1990 Nov 1;29(31):4638-45. doi: 10.1364/AO.29.004638.
The effects of polarizer leakage on reflectivity measurements have been determined analytically and experimentally. It is shown that for values of the extinction ratio larger than 10(-3) the inferred refractive index of dielectric materials from reflectivity measurements maybe in error by 27% or more. On the other hand, the real and imaginary parts of the index of carbonaceous materials may be in error by more than 30 and 60%, respectively. Furthermore, when the specularity index of smooth surfaces is to be determined, significant differences (68% or more) may result for the same range of values of the extinction ratio. A method is presented for correcting the reflectivity measurements for polarizer leakage based on the extinction ratio of the polarizer. In addition, analytical expressions are provided for the determination of the actual value of the extinction ratio of a given polarizing film at any wavelength. The effects of the typical and actual values of the extinction ratio on the inferred optical constants and specularity index of dielectric and absorbing materials are assessed.
已通过分析和实验确定了偏振器泄漏对反射率测量的影响。结果表明,对于消光比大于10^(-3) 的情况,通过反射率测量推断的介电材料折射率可能会有27% 或更高的误差。另一方面,含碳材料折射率的实部和虚部分别可能有超过30% 和60% 的误差。此外,当要确定光滑表面的镜面反射率指数时,对于相同的消光比取值范围可能会产生显著差异(68% 或更高)。提出了一种基于偏振器消光比校正偏振器泄漏导致的反射率测量结果的方法。此外,还给出了用于确定给定偏振膜在任何波长下消光比实际值的解析表达式。评估了消光比的典型值和实际值对推断的介电和吸收材料光学常数及镜面反射率指数的影响。