Kitsara Maria, Misiakos Konstantinos, Raptis Ioannis, Makarona Eleni
Institute of Microelectronics, NCSR Demokritos, Aghia Paraskevi 153 10, Athens, Greece.
Opt Express. 2010 Apr 12;18(8):8193-206. doi: 10.1364/OE.18.008193.
Integrated Optical Frequency-Resolved Mach-Zehnder Interferometry (IO FR-MZI) is introduced as an alternative, cost-efficient operation principle for integrated optical label-free affinity sensors that can combine high sensitivity with high versatility in terms of potential applications and experimental configurations. A detailed theoretical analysis of the method is presented followed by a semi-analytical approximation and numerical calculations in order to quantify the sensitivity and limits of detection of the FR-MZI over Single Wavelength MZI. The obtained results substantiate that IO FR-MZI- based sensors constitute a generic technological platform of high sensitivity that can be implemented into a plethora of detection schemes. For an optimized optical design well below 1mm in length the limit of detection can be as low as 0.025A in terms of adlayer effective thickness allowing for truly miniaturized integrated optical sensors fabricated with high yield with standard microfabrication techniques.
集成光学频率分辨马赫曾德尔干涉仪（IO FR-MZI）被引入作为集成光学无标记亲和传感器的一种替代的、具有成本效益的操作原理，该传感器在潜在应用和实验配置方面可将高灵敏度与高通用性相结合。本文对该方法进行了详细的理论分析，随后进行了半解析近似和数值计算，以量化FR-MZI相对于单波长MZI的灵敏度和检测限。所得结果证实，基于IO FR-MZI的传感器构成了一个高灵敏度的通用技术平台，可应用于大量检测方案。对于长度远低于1mm的优化光学设计，就吸附层有效厚度而言，检测限可低至0.025A，从而能够采用标准微加工技术以高成品率制造真正小型化的集成光学传感器。
