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偏振光学中的穆勒矩阵插值

Mueller matrix interpolation in polarization optics.

作者信息

Devlaminck V

机构信息

LAGIS-FRE CNRS 3303, Université Lille 1, Sciences et Technologies, Cité Scientifique, 59655 Villeneuve, France.

出版信息

J Opt Soc Am A Opt Image Sci Vis. 2010 Jul 1;27(7):1529-34. doi: 10.1364/JOSAA.27.001529.

Abstract

The question of the physical significance of the Mueller matrix average is addressed by means of an analysis of interpolation processes. We draw a comparison between two interpolation processes. The first one is related to the classical Euclidean metrics and the second one is based on the log-Euclidean metrics. Both the associated interpolation procedures are depicted with their underlying physical models. Addressing the question of the physical meaning of the log-Euclidean process of interpolation is founded on a very similar approach to the layered-medium interpretation proposed by Jones [J. Opt. Soc. Am.38, 671 (1948)] in the seventh paper of his series. Based on the analysis of their respective properties, we eventually show that the choice between both these interpolation processes may depend on what statistical situation is considered or what underlying physical model is assumed.

摘要

通过对插值过程的分析来探讨穆勒矩阵平均值的物理意义问题。我们对两种插值过程进行比较。第一种与经典欧几里得度量相关,第二种基于对数欧几里得度量。两种相关的插值过程都与其潜在的物理模型一起进行了描述。探讨对数欧几里得插值过程的物理意义问题所基于的方法,与琼斯[《美国光学学会杂志》38, 671 (1948)]在其系列的第七篇论文中提出的分层介质解释非常相似。基于对它们各自特性的分析,我们最终表明,这两种插值过程之间的选择可能取决于所考虑的统计情况或所假设的潜在物理模型。

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