横向掺杂银的DNA的电导率研究。

Study on the Electric Conductivity of Ag-Doped DNA in Transverse Direction.

作者信息

Ban Ge, Dong Ruixin, Li Ke, Han Hongwen, Yan Xunling

机构信息

School of Physical Science and Information Technology, Liaocheng University, Liaocheng, Shandong 252059 China.

出版信息

Nanoscale Res Lett. 2009 Jan 17;4(4):321-326. doi: 10.1007/s11671-008-9245-y.

DOI:10.1007/s11671-008-9245-y

PMID:20596459

原文链接:https://pmc.ncbi.nlm.nih.gov/articles/PMC2893934/

Abstract

In this article, we reported a novel experiment results on Ag-doped DNA conductor in transverse direction. I-V characteristics were measured and the relative conductances were calculated for different silver ions concentrations. With the increase of the concentration of silver ions, the conductive ability of DNA risen rapidly, the relative conductance of DNA enhanced about three magnitudes and reached a stable value when Ag(+) concentration was up to 0.005 mM. In addition, Raman spectra were carried out to analyse and confirm conduction mechanism.

摘要

在本文中，我们报道了关于横向掺杂银的DNA导体的一项新实验结果。测量了电流-电压（I-V）特性，并针对不同银离子浓度计算了相对电导率。随着银离子浓度的增加，DNA的导电能力迅速提高，当银离子浓度达到0.005 mM时，DNA的相对电导率提高了约三个数量级并达到稳定值。此外，进行了拉曼光谱分析以确认传导机制。