Istituto Nazionale di Ricerca Metrologica, Torino, Italy.
IEEE Trans Ultrason Ferroelectr Freq Control. 2010 Jul;57(7):1524-34. doi: 10.1109/TUFFC.2010.1583.
In this paper we report an analysis of the physical phenomena that can affect the frequency stability of optically pumped vapor cell clocks working in pulsed regime. It is well known that the pulsed approach allows a strong reduction of the light shift that is one of the main sources of frequency instability. However, other instability sources can degrade clock performance by limiting both short- and medium-term frequency stability. After recognizing the different noise sources and realizing how they are transferred to the clock transition, we propose some technical solutions to limit their effects, extending the region of white frequency noise up to integration times tau of the order of 10(4) s.
本文分析了影响光抽运蒸气室时钟在脉冲工作模式下频率稳定性的物理现象。众所周知，脉冲方法可以大大降低光频移，而光频移是频率不稳定性的主要来源之一。然而，其他不稳定性源会限制短时间和长时间的频率稳定性，从而降低时钟性能。在识别不同的噪声源并了解它们如何传递到时钟跃迁之后，我们提出了一些技术解决方案来限制它们的影响，将白频噪声的区域扩展到 10(4) s 量级的积分时间 tau。
