Schnablegger H, Glatter O
Appl Opt. 1991 Nov 20;30(33):4889-96. doi: 10.1364/AO.30.004889.
Optical particle sizing in the range of 10 nm up to several micrometers by means of quasi-elastic and elastic light scattering requires sophisticated data inversion techniques. We have developed an optimized regularization technique that can be used for the inversion of such light-scattering data. The technique has been successfully tested for a large number of simulated and measured data. It is easy to handle. Typical problems that arise in practical applications are discussed.
通过准弹性和弹性光散射对10纳米至几微米范围内的光学粒子进行尺寸测量需要复杂的数据反演技术。我们开发了一种优化的正则化技术,可用于此类光散射数据的反演。该技术已成功针对大量模拟和测量数据进行了测试。它易于处理。文中讨论了实际应用中出现的典型问题。