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采用 X 射线计算机断层扫描技术研究饼干和面包干的新方法。

A novel approach to study biscuits and breadsticks using X-ray computed tomography.

机构信息

Dept. of Food Science, Univ. of Foggia, Foggia, Italy.

出版信息

J Food Sci. 2010 Aug 1;75(6):E353-8. doi: 10.1111/j.1750-3841.2010.01689.x.

Abstract

In this study X-ray microtomography (muCT) was used for analysis of the microstructure of 6 different types of Italian biscuits and 3 types of Italian breadsticks. Appropriate quantitative 3-D parameters describing the microstructure were calculated, such as the structure thickness (ST), the object structure volume ratio (OSVR), the degree of anisotropy (DA), and the percentage object volume (POV). Sensory analysis was also performed to discriminate samples on the basis of texture characteristics. A correlation between microstructural data (OSVR for biscuits and OSVR, POV, and DA for breadsticks) and sample crunchiness was also found. Results obtained from the current study showed that analysis at a microscopic level could be useful to the food industry, as the accurate calculation of number, dimension, and distribution of pores in the products could be used to improve the sensorial properties of food. Further study by muCT could be carried out to correlate microstructure to specific ingredients and process conditions to allow obtaining more tailored food.

摘要

在这项研究中,X 射线微断层扫描(μCT)用于分析 6 种不同类型的意大利饼干和 3 种意大利面包棍的微观结构。计算了描述微观结构的适当的定量 3D 参数,例如结构厚度(ST)、物体结构体积比(OSVR)、各向异性程度(DA)和物体体积百分比(POV)。还进行了感官分析,以便根据质地特征对样品进行区分。还发现微观结构数据(饼干的 OSVR 与面包棍的 OSVR、POV 和 DA)与样品脆性之间存在相关性。本研究的结果表明,在微观水平上进行分析可能对食品工业有用,因为可以准确计算产品中孔的数量、尺寸和分布,从而改善食品的感官特性。通过 μCT 进一步研究可以将微观结构与特定成分和加工条件相关联,从而获得更具针对性的食品。

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