Kaufman R G, Hulse G, Vezzetti D J, Munowitz M, Stair K, Bird T
Appl Opt. 1992 Aug 20;31(24):4920-2. doi: 10.1364/AO.31.004920.
Analysis of infrared images of spatial beats between two discrete modes in a single waveguide is shown to provide a useful consistency check on the thicknesses and refractive indices of the dielectric layers.
对单波导中两个离散模式之间空间拍频的红外图像进行分析，结果表明，这可为介电层的厚度和折射率提供有用的一致性检验。
