用于光学各向异性元件的腔内透射椭圆偏振测量法。

Intracavity transmission ellipsometry for optically anisotropic components.

作者信息

Holzapfel W, Neuschaefer-Rube S, Neuschaefer-Rube U

出版信息

Appl Opt. 1993 Oct 20;32(30):6022-31. doi: 10.1364/AO.32.006022.

DOI:10.1364/AO.32.006022

PMID:20856429

Abstract

The relative retardation Δ, the orientation of the main axis φ, the polarization-dependent loss angle Ψ, and the reciprocal and the nonreciprocal rotation angle ρ of optical components can be determined, in principle, by intracavity ellipsometry. The component under test is placed inside a phase-modulated cw laser, which causes a change in the beat frequency, beam polarization, and intensity. Using the diode-pumped Nd:YAG-laser ellipsometer, we demonstrate with our preliminary measurements of Δ and φ the feasibility and precision of intracavity ellipsometry for measuring optically anisotropic components.

摘要

原则上，光学元件的相对延迟Δ、主轴方向φ、偏振相关损耗角Ψ以及光学元件的旋光率倒数和非互易旋转角ρ可通过腔内椭偏测量法来确定。被测元件置于相位调制连续波激光器内，这会导致拍频、光束偏振和强度发生变化。利用二极管泵浦的Nd:YAG激光椭偏仪，我们通过对Δ和φ的初步测量证明了腔内椭偏测量法用于测量光学各向异性元件的可行性和精度。