Holzapfel W, Neuschaefer-Rube S, Neuschaefer-Rube U
Appl Opt. 1993 Oct 20;32(30):6022-31. doi: 10.1364/AO.32.006022.
The relative retardation Δ, the orientation of the main axis φ, the polarization-dependent loss angle Ψ, and the reciprocal and the nonreciprocal rotation angle ρ of optical components can be determined, in principle, by intracavity ellipsometry. The component under test is placed inside a phase-modulated cw laser, which causes a change in the beat frequency, beam polarization, and intensity. Using the diode-pumped Nd:YAG-laser ellipsometer, we demonstrate with our preliminary measurements of Δ and φ the feasibility and precision of intracavity ellipsometry for measuring optically anisotropic components.