相似文献
1
Characterization of inhomogeneous transparent thin films on transparent substrates by spectroscopic ellipsometry: refractive indices n(λ) of some fluoride coating materials.
Appl Opt. 1994 May 1;33(13):2664-71. doi: 10.1364/AO.33.002664.
2
Determination of the optical constants of an inhomogeneous transparent LaF(3) thin film on a transparent substrate by spectroscopic ellipsometry.
Opt Lett. 1992 Apr 1;17(7):538-40. doi: 10.1364/ol.17.000538.
3
Optical characterization of low-index transparent thin films on transparent substrates by spectroscopic ellipsometry.
Appl Opt. 1987 Sep 15;26(18):3796-802. doi: 10.1364/AO.26.003796.
4
Determination of the optical function n(λ) of vitreous silica by spectroscopic ellipsometry with an achromatic compensator.
Appl Opt. 1993 Nov 1;32(31):6391-8. doi: 10.1364/AO.32.006391.
5
Optical functions of transparent thin films of SrTiO(3), BaTiO(3), and SiO(x) determined by spectroscopic ellipsometry.
Appl Opt. 1994 Sep 1;33(25):6053-8. doi: 10.1364/AO.33.006053.
6
Spectroscopic ellipsometry study on refractive index spectra of colloidal β-FeOOH nanorods with their self-assembled thin films.
Langmuir. 2011 Mar 15;27(6):2895-903. doi: 10.1021/la1039706. Epub 2011 Feb 10.
7
Measurement of the refractive index and thickness for infrared optical films deposited on rough substrates.
Appl Opt. 1992 Oct 1;31(28):6139-44. doi: 10.1364/AO.31.006139.
8
Simultaneous determination of refractive index, its dispersion and depth-profile of magnesium oxide thin film by spectroscopic ellipsometry.
Appl Opt. 1989 Jul 15;28(14):2691-4. doi: 10.1364/AO.28.002691.
9
Complex refractive indices of thin films of secondary organic materials by spectroscopic ellipsometry from 220 to 1200 nm.
Environ Sci Technol. 2013;47(23):13594-601. doi: 10.1021/es403411e. Epub 2013 Nov 19.
10
Estimate of the degree of inhomogeneity of the refractive index of dielectric films from spectroscopic ellipsometry.
Appl Opt. 1992 Oct 1;31(28):6056-61. doi: 10.1364/AO.31.006056.
引用本文的文献
1
Microstructure-Induced Anisotropic Optical Properties of YF Columnar Thin Films Prepared by Glancing Angle Deposition.
Nanomaterials (Basel). 2020 Dec 3;10(12):2413. doi: 10.3390/nano10122413.
Zotero 插件