Woods T N, Wrigley Iii R T, Rottman G J, Haring R E
Appl Opt. 1994 Jul 1;33(19):4273-85. doi: 10.1364/AO.33.004273.
One of the many calibrations performed for a scientific-quality spectrometer is the characterization of its scattered-light properties. The scattered light can arise from any optical surface, and light leaks or scattering from baffles can also contribute to the instrumental stray-light level. For a diffraction-grating spectrometer the primary contribution to instrumental scattered light has been found to be the scattered light from the grating. The results from measuring the scattered-light properties of 10 diffraction gratings are discussed along with the application of these results in analyzing the total scattered light measured for three spectrometers. It has been found from these measurements that there are two components of the grating scattered light: a Lorentzian-type component and a constant background component. The Lorentzian component is predicted from the diffraction theory for a grating, and the constant background component is consistent with Rayleigh scattering from the microscopic surface im erfections. It was also discovered that multiple replicas of gratings from the same master grating exhibit significantly more scattered light than the preceding replica by factors of 1.1-2.
对一台具备科学品质的光谱仪进行的众多校准操作之一，是对其散射光特性进行表征。散射光可能源于任何光学表面，并且来自遮光板的光泄漏或散射也会对仪器的杂散光水平产生影响。对于衍射光栅光谱仪，已发现仪器散射光的主要贡献来自光栅的散射光。文中讨论了测量10个衍射光栅散射光特性的结果，以及这些结果在分析三台光谱仪所测总散射光中的应用。从这些测量中发现，光栅散射光有两个分量：一个洛伦兹型分量和一个恒定背景分量。洛伦兹分量可由光栅的衍射理论预测得出，而恒定背景分量与微观表面缺陷产生的瑞利散射相符。还发现，同一母光栅的多个光栅复制件所表现出的散射光比前一个复制件明显多1.1至2倍。
