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一种在高精度光子轨道角动量谱测量中处理仪器光学像差效应的综合方法。

A comprehensive approach to deal with instrumental optical aberrations effects in high-accuracy photon's orbital angular momentum spectrum measurements.

作者信息

Uribe-Patarroyo Néstor, Alvarez-Herrero Alberto, Belenguer Tomás

机构信息

Laboratorio de Instrumentación Espacial (LINES), Instituto Nacional de Técnica Aeroespacial, E-28850, Madrid, Spain.

出版信息

Opt Express. 2010 Sep 27;18(20):21111-20. doi: 10.1364/OE.18.021111.

DOI:10.1364/OE.18.021111
PMID:20941007
Abstract

With the current and upcoming applications of beams carrying orbital angular momentum (OAM), there will be the need to generate beams and measure their OAM spectrum with high accuracy. The instrumental OAM spectrum distortion is connected to the effect of its optical aberrations on the OAM content of the beams that the instrument creates or measures. Until now, the effect of the well-known Zernike aberrations has been studied partially, assuming vortex beams with trivial radial phase components. However, the traditional Zernike polynomials are not best suitable when dealing with vortex beams, as their OAM spectrum is highly sensitive to some Zernike terms, and completely insensitive to others. We propose the use of a new basis, the OAM-Zernike basis, which consists of the radial aberrations as described by radial Zernike polynomials and of the azimuthal aberrations described in the OAM basis. The traditional tools for the characterization of aberrations of optical instruments can be used, and the results translated to the new basis. This permits the straightforward calculation of the effect of any optical system, such as an OAM detection stage, on the OAM spectrum of an incoming beam. This knowledge permits to correct, a posteriori, the effect of instrumental OAM spectrum distortion on the measured spectra. We also found that the knowledge of the radial aberrations is important, as they affect the efficiency of the detection, and in some cases its accuracy. In this new framework, we study the effect of aberrations in common OAM detection methods, and encourage the characterization of those systems using this approach.

摘要

随着当前和即将出现的携带轨道角动量(OAM)光束的应用,将需要高精度地产生光束并测量其OAM谱。仪器的OAM谱失真与仪器产生或测量的光束的光学像差对光束OAM含量的影响有关。到目前为止,对于著名的泽尼克像差的影响只是部分地进行了研究,假设涡旋光束具有简单的径向相位分量。然而,传统的泽尼克多项式在处理涡旋光束时并不是最合适的,因为它们的OAM谱对某些泽尼克项高度敏感,而对其他项则完全不敏感。我们建议使用一种新的基,即OAM-泽尼克基,它由径向泽尼克多项式描述的径向像差和OAM基中描述的方位像差组成。可以使用传统的光学仪器像差表征工具,并将结果转换到新的基中。这允许直接计算任何光学系统,比如一个OAM检测阶段,对入射光束的OAM谱的影响。这种知识允许事后校正仪器OAM谱失真对测量谱的影响。我们还发现径向像差的知识很重要,因为它们会影响检测效率,在某些情况下还会影响检测精度。在这个新框架中,我们研究了常见OAM检测方法中像差的影响,并鼓励使用这种方法对那些系统进行表征。

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