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全基因组关联分析鉴定普通小麦(Triticum aestivum L.)种质资源中多个耐铝位点。

Genome-wide association analyses of common wheat (Triticum aestivum L.) germplasm identifies multiple loci for aluminium resistance.

机构信息

EH Graham Centre for Agricultural Innovation, Wagga Wagga Agricultural Institute, Wagga Wagga, NSW 2650, Australia.

出版信息

Genome. 2010 Nov;53(11):957-66. doi: 10.1139/G10-058.

DOI:10.1139/G10-058
PMID:21076511
Abstract

Aluminium (Al3+) toxicity restricts productivity and profitability of wheat (Triticum aestivum L.) crops grown on acid soils worldwide. Continued gains will be obtained by identifying superior alleles and novel Al3+ resistance loci that can be incorporated into breeding programs. We used association mapping to identify genomic regions associated with Al3+ resistance using 1055 accessions of common wheat from different geographic regions of the world and 178 polymorphic diversity arrays technology (DArT) markers. Bayesian analyses based on genetic distance matrices classified these accessions into 12 subgroups. Genome-wide association analyses detected markers that were significantly associated with Al3+ resistance on chromosomes 1A, 1B, 2A, 2B, 2D, 3A, 3B, 4A, 4B, 4D, 5B, 6A, 6B, 7A, and 7B. Some of these genomic regions correspond to previously identified loci for Al3+ resistance, whereas others appear to be novel. Among the markers targeting TaALMT1 (the major Al3+-resistance gene located on chromosome 4D), those that detected alleles in the promoter explained most of the phenotypic variance for Al3+ resistance, which is consistent with this region controlling the level of TaALMT1 expression. These results demonstrate that genome-wide association mapping cannot only confirm known Al3+-resistance loci, such as those on chromosomes 4D and 4B, but they also highlight the utility of this technique in identifying novel resistance loci.

摘要

铝(Al3+)毒性限制了全球酸性土壤上小麦(Triticum aestivum L.)作物的生产力和盈利能力。通过鉴定优异的等位基因和新的 Al3+抗性基因座,并将其整合到育种计划中,可以获得持续的进展。我们使用关联图谱分析,使用来自世界各地不同地理区域的 1055 个普通小麦品系和 178 个多态性多样性数组技术(DArT)标记,鉴定与 Al3+抗性相关的基因组区域。基于遗传距离矩阵的贝叶斯分析将这些品系分为 12 个亚组。全基因组关联分析检测到与染色体 1A、1B、2A、2B、2D、3A、3B、4A、4B、4D、5B、6A、6B、7A 和 7B 上 Al3+抗性显著相关的标记。其中一些基因组区域与先前鉴定的 Al3+抗性基因座相对应,而另一些则似乎是新的。在针对 TaALMT1(位于染色体 4D 上的主要 Al3+抗性基因)的标记中,那些在启动子中检测到等位基因的标记解释了 Al3+抗性的大部分表型方差,这与该区域控制 TaALMT1 表达水平的情况一致。这些结果表明,全基因组关联图谱不仅可以确认已知的 Al3+抗性基因座,如染色体 4D 和 4B 上的基因座,还可以突出该技术在鉴定新的抗性基因座方面的效用。

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