School of Electrical and Computer Engineering, Georgia Institute of Technology, Atlanta, Georgia 30332-0250, USA.
Opt Lett. 2010 Nov 15;35(22):3814-6. doi: 10.1364/OL.35.003814.
We report experimental excitation and characterization of surface plasmon modes in planar metal-insulator-metal (MIM) waveguides. Our approach is based on determining the width of the reflection angular spectrum in the attenuated total reflection (ATR) configuration. Owing to its transverse character, the ATR configuration provides a more straightforward and simpler way to determine the loss of plasmonic modes in MIM structures, compared to using tapered end couplers with multiple waveguide samples or scanning near-field optical microscopy. In this Letter, two waveguide structures with Au claddings and 50/200 nm SiO(2) cores are investigated. The propagation lengths measured at λ = 1.55 μm are 5.7 and 18 μm, respectively, in agreement with the theoretical predictions.
我们报告了在平面金属-绝缘体-金属（MIM）波导中表面等离激元模式的实验激发和特性。我们的方法基于确定衰减全反射（ATR）配置中反射角谱的宽度。由于其横向特性，与使用带有多个波导样品的锥形端耦合器或扫描近场光学显微镜相比，ATR 配置为确定 MIM 结构中的等离子体模式损耗提供了更直接、更简单的方法。在这封信中，研究了两种具有金覆盖层和 50/200nmSiO2 芯的波导结构。在 λ = 1.55 μm 处测量的传播长度分别为 5.7 和 18 μm，与理论预测相符。
