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相关离子分析与原子探针质谱谱图解析。

Correlated ion analysis and the interpretation of atom probe mass spectra.

机构信息

Department of Materials, University of Oxford, Parks Rd, Oxford OX1 3PH, UK.

出版信息

Ultramicroscopy. 2011 May;111(6):473-9. doi: 10.1016/j.ultramic.2010.11.021. Epub 2010 Nov 20.

DOI:10.1016/j.ultramic.2010.11.021
PMID:21159435
Abstract

Several techniques are presented for extracting information from atom probe mass spectra by investigating correlations within multiple-ion detector events. Analyses of this kind can provide insights into the origins of noise, the shape of mass peaks, or unexpected anomalies within the spectrum. Data can often be recovered from within the spectrum noise by considering the time-of-flight differences between ions within a multiple event. Correlated ion detection, particularly when associated with shifts in ion energies, may be used to probe the phenomenon of molecular ion dissociation, including the questions of data loss due to ion pile-up or the generation of neutrals in the dissociation process.

摘要

介绍了几种通过研究多离子探测器事件内的相关性从原子探针质谱中提取信息的技术。这种分析可以深入了解噪声的来源、质谱峰的形状或谱内异常情况。通过考虑多事件中离子之间的飞行时间差异,可以从谱噪声中恢复数据。相关离子检测,特别是与离子能量变化相关联时,可用于探测分子离子离解现象,包括由于离子堆积而导致的数据丢失或离解过程中中性粒子的产生等问题。

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