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基于环绕通量的优化简单发射条件,用于多模聚合物光波导评估的标准化。

Encircled Flux-based optimized simple launch condition for standardization of multimode polymer optical waveguide evaluations.

作者信息

Tan Freddy Susanto, Sugihara Okihiro, Kaino Toshikuni

机构信息

Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, 2-1-1 Katahira, Aoba-ku, Sendai 980-8577, Japan.

出版信息

Opt Express. 2010 Nov 8;18(23):23554-61. doi: 10.1364/OE.18.023554.

Abstract

Multimode polymer optical waveguide evaluations by using a combination of multimode optical fibers (MMF) and Light Emitting Diode (LED) give very often inconsistent experimental result. It is due to the over-filled properties of the launch light created by this configuration. We propose an optimized simple launch configuration to overcome the problems by using similar configuration. The optimized launch configuration creates an optimal-filled launch light where its encircled flux (EF) profile satisfies the EF template provided by the International Electrotechnical Commission (IEC). We have used the standard optical fibers and optical fiber adaptors to create the optimized simple launch configuration with high stability. Therefore, our proposed launch configuration is suitable for realizing a cost effective optimized launch configuration for standardization of multimode polymer optical waveguide evaluations. We demonstrated reliability of the proposed launch configuration by examining the reproducibility of the insertion loss (IL) measurements. We have used two waveguide samples that have different characteristics for this purpose. It was found that the insertion loss (IL) measurements of the two samples are consistent with the largest variation of less than 5%. This variation is better than the proposed value given by the IEC that is 10%.

摘要

通过结合多模光纤(MMF)和发光二极管(LED)对多模聚合物光波导进行评估,实验结果常常不一致。这是由于这种配置产生的入射光存在过填充特性。我们提出一种优化的简单入射配置,通过使用类似配置来克服这些问题。优化后的入射配置能产生最佳填充的入射光,其包层光通量(EF)分布满足国际电工委员会(IEC)提供的EF模板。我们使用标准光纤和光纤适配器创建了具有高稳定性的优化简单入射配置。因此,我们提出的入射配置适用于实现一种经济高效的优化入射配置,用于多模聚合物光波导评估的标准化。我们通过检查插入损耗(IL)测量的可重复性来证明所提出入射配置的可靠性。为此,我们使用了两个具有不同特性的波导样品。结果发现,两个样品的插入损耗(IL)测量结果一致,最大变化小于5%。这种变化优于IEC提出的10%的数值。

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